Electrically detected magnetic resonance modeling and fitting: An equivalent circuit approach

被引:1
|
作者
Leite, D. M. G. [1 ]
Batagin-Neto, A. [2 ]
Nunes-Neto, O. [2 ]
Gomez, J. A. [3 ]
Graeff, C. F. O. [2 ,4 ]
机构
[1] UNIFEI Univ Fed Itajuba, BR-37500903 Itajuba, MG, Brazil
[2] UNESP Univ Estadual Paulista, POSMAT Programa Posgrad Ciencia & Tecnol Mat, BR-17033360 Bauru, SP, Brazil
[3] FFCLRP USP, Dept Fis, BR-14040901 Ribeirao Preto, SP, Brazil
[4] UNESP Univ Estadual Paulista, DF FC, BR-17033360 Bauru, SP, Brazil
基金
巴西圣保罗研究基金会;
关键词
SPIN-DEPENDENT PROCESSES; EXCITON FORMATION; RECOMBINATION; SILICON; TRANSPORT; TRANSISTORS; STATES; EDMR;
D O I
10.1063/1.4862178
中图分类号
O59 [应用物理学];
学科分类号
摘要
The physics of electrically detected magnetic resonance (EDMR) quadrature spectra is investigated. An equivalent circuit model is proposed in order to retrieve crucial information in a variety of different situations. This model allows the discrimination and determination of spectroscopic parameters associated to distinct resonant spin lines responsible for the total signal. The model considers not just the electrical response of the sample but also features of the measuring circuit and their influence on the resulting spectral lines. As a consequence, from our model, it is possible to separate different regimes, which depend basically on the modulation frequency and the RC constant of the circuit. In what is called the high frequency regime, it is shown that the sign of the signal can be determined. Recent EDMR spectra from Alq(3) based organic light emitting diodes, as well as from a-Si: H reported in the literature, were successfully fitted by the model. Accurate values of g-factor and linewidth of the resonant lines were obtained. (C) 2014 AIP Publishing LLC.
引用
收藏
页数:10
相关论文
共 50 条
  • [31] Resonance-field dependence in electrically detected magnetic resonance: Effects of exchange interaction
    Fukui, K
    Sato, T
    Yokoyama, H
    Ohya, H
    Kamada, H
    JOURNAL OF MAGNETIC RESONANCE, 2001, 149 (01) : 13 - 21
  • [32] Thermal annealing effects on polyaniline studied by electrically detected magnetic resonance
    Graeff, CFO
    Brunello, CA
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 2000, 273 (1-3) : 289 - 293
  • [33] Coherent defect spectroscopy with pulsed optically and electrically detected magnetic resonance
    C. Boehme
    K. Lips
    Journal of Materials Science: Materials in Electronics, 2007, 18 : 285 - 291
  • [34] Coherent defect spectroscopy with pulsed optically and electrically detected magnetic resonance
    Boehme, C.
    Lips, K.
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2007, 18 (Suppl 1) : S285 - S291
  • [35] Electrically Detected Magnetic Resonance of Donors and Interfacial Defects in Silicon Nanowires
    Fanciulli, M.
    Vellei, A.
    Canevali, C.
    Baldovino, S.
    Pennelli, G.
    Longo, M.
    NANOSCIENCE AND NANOTECHNOLOGY LETTERS, 2011, 3 (04) : 568 - 574
  • [36] Electrically and optically detected magnetic resonance in GaN-based LEDs
    Carlos, WE
    DEFECTS IN SEMICONDUCTORS - ICDS-19, PTS 1-3, 1997, 258-2 : 1105 - 1112
  • [37] Electrically Detected Magnetic Resonance in Dielectric Semiconductor Systems of Current Interest
    Lenahan, P. M.
    Cochrane, C. J.
    Campbell, J. P.
    Ryan, J. T.
    SILICON NITRIDE, SILICON DIOXIDE, AND EMERGING DIELECTRICS 11, 2011, 35 (04): : 605 - 627
  • [38] Investigation of electronic transitions in semiconductors with pulsed electrically detected magnetic resonance
    C. Boehme
    K. Lips
    Applied Magnetic Resonance, 2004, 27 : 109 - 122
  • [39] Suppression of microwave rectification effects in electrically detected magnetic resonance measurements
    Lo, C. C.
    Bradbury, F. R.
    Tyryshkin, A. M.
    Weis, C. D.
    Bokor, J.
    Schenkel, T.
    Lyon, S. A.
    APPLIED PHYSICS LETTERS, 2012, 100 (06)
  • [40] Electrically detected magnetic resonance of organic and polymeric light emitting diodes
    Castro, FA
    Silva, GB
    Santos, LF
    Faria, RM
    Nüesch, F
    Zuppiroli, L
    Graeff, CFO
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 2004, 338 : 622 - 625