Editorial: Special Issue on Deep Learning for Data Quality

被引：0
|
作者：
Santoro, Donatello [1 ]
Thirumuruganathan, Saravanan [2 ]
Papotti, Paolo [3 ]
机构：
[1] Univ Basilicata, Via Ateneo Lucano 10, I-85100 Potenza, Italy
[2] HBKU, Qatar Comp Res Inst, Doha 34110, Qatar
[3] EURECOM, 450 Route Chappes, F-06410 Biot, France
来源：
ACM JOURNAL OF DATA AND INFORMATION QUALITY | 2022年 / 14卷 / 03期
关键词：
data labeling; Deep learning; schema matching;
D O I：
10.1145/3513135
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
This editorial summarizes the content of the Special Issue on Deep Learning for Data Quality of the Journal of Data and Information Quality (JDIQ). © 2022 Association for Computing Machinery.
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收藏
页数：3
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