Electrical transport in Nb/Cu multilayers

被引：2
|
作者：
Seng, P [1 ]
Tidecks, R [1 ]
Samwer, K [1 ]
Logvenov, GY [1 ]
Oboznov, VA [1 ]
机构：
[1] RUSSIAN ACAD SCI, INST SOLID STATE PHYS, CHERNOGOLOVKA 142432, RUSSIA
来源：
JOURNAL OF LOW TEMPERATURE PHYSICS | 1997年 / 106卷 / 1-2期
关键词：
D O I：
10.1007/BF02403914
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The longitudinal resistance, R(xx), the Hall resistance, R(xy), and the critical current density, j(c), were measured for two Nb/Cu multilayers with different thickness of the Cu layers. The magnetic field was applied perpendicular to interpreted using a phenomenological model. The temperature dependence of j(c)(T)=j(c0)(1 - T/T-c0)(2)/T-5/2 coincides with the theory of Aslamazov, D'yachkou, and Lempitskii.
引用
收藏
页码：29 / 48
页数：20
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