Reliability and Failure Modes of Solid-State Lighting Electrical Drivers Subjected to Accelerated Aging

被引：23
|
作者：
Lall, Pradeep [1 ]
Sakalaukus, Peter [1 ]
Davis, Lynn [2 ]
机构：
[1] Auburn Univ, Dept Mech Engn, NSF Elect Res Ctr CAVE3, Auburn, AL 36849 USA
[2] RTI Int, Durham, NC 27709 USA
来源：
IEEE ACCESS | 2015年 / 3卷
基金：
美国国家科学基金会;
关键词：
Electrolytic capacitor; solid-state lighting; LED; ELECTROLYTIC CAPACITOR; WHITE LEDS; TEMPERATURES; PREDICTION;
D O I：
10.1109/ACCESS.2015.2404812
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
An investigation of an off-the-shelf solid-state lighting device with the primary focus on the accompanied light-emitting diode (LED) electrical driver (ED) has been conducted. A set of 10 EDs were exposed to temperature humidity life testing of 85% RH and 85 degrees C (85/85) without an electrical bias per the JEDEC standard JESD22-A101C in order to accelerate the ingress of moisture into the aluminum electrolytic capacitor (AEC) and the EDs in order to assess the reliability of the LED drivers for harsh environment applications. The capacitance and equivalent series resistance for each AEC inside the ED were measured using a handheld LCR meter as possible leading indications of failure. The photometric quantities of a single pristine light engine were monitored in order to investigate the interaction between the light engine and the EDs. These parameters were used in assessing the overall reliability of the EDs. In addition, a comparative analysis has been conducted between the 85/85 accelerated test data and a previously published high-temperature storage life accelerated test of 135 degrees C. The results of the 85/85 acceleration test and the comparative analysis are presented in this paper.
引用
收藏
页码：531 / 542
页数：12
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