On-Orbit Single Event Effect of the Digital Signal Processor of the Alpha Magnetic Spectrometer and Discrepancy Analysis for the Rate Prediction

被引：3

作者：

Fan, Yun Yun ^{[1
]}

Cai, Xu Dong ^{[2
]}

He, Chao Hui ^{[1
]}

Liu, Dong ^{[3
]}

机构：

[1] Xi An Jiao Tong Univ, Dept Nucl Sci & Technol, Xian 710049, Shaanxi, Peoples R China

[2] MIT, Dept Phys, Cambridge, MA 02139 USA

[3] Acad Sinica, Inst Phys, Taipei 11529, Taiwan

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2018年 / 65卷 / 05期

基金：

中国国家自然科学基金;

关键词：

DSP; International Space Station (ISS); prediction; single event function interrupt (SEFI); single event upset (SEU); NUCLEAR-REACTIONS; RADIATION; SRAMS; ENVIRONMENT; STRESS; UPSETS; MODEL; SEU;

D O I：

10.1109/TNS.2018.2826538

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Three hundred commercial off-the-shelf ADSP-2187L chips on AMS-02 have been operating without major problems on the International Space Station since launch. The conversion rates from the single event upset (SEU) to single event function interrupt varied with the operation methods. The correlation between the on-orbit SEU and radiation environments during the 24th solar cycle was studied. The on-orbit SEU rate was much lower than expected. Possible reasons for the higher predicted SEU rate were discussed and thought to be the different circuit operations of the ground test method and the on-orbit one in the sensitive linear energy transfer range.

引用

页码：1140 / 1146

页数：7

共 6 条

[1] Single Event Upset Analysis: On-orbit performance of the Alpha Magnetic Spectrometer Digital Signal Processor Memory aboard the International Space Station
Li, Jiaqiang
Choutko, Vitaly
Xiao, Liyi
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2018, 885 : 98 - 104
[2] Single Event Effect Vulnerability Analysis and On-orbit Error Rate Prediction
He Wei
Wang Yueke
Xing Kefei
Deng Wei
2016 IEEE INTERNATIONAL CONFERENCE ON SIGNAL AND IMAGE PROCESSING (ICSIP), 2016, : 471 - 477
[3] On-orbit unusual temperature and analysis of thermal response of alpha magnetic spectrometer
Cheng, Lin, 1600, Materials China (65):
[4] Single-event effects ground testing and on-orbit rate prediction methods: The past, present, and future
Reed, RA
Kinnison, J
Pickel, JC
Buchner, S
Marshall, PW
Kniffin, S
LaBel, KA
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2003, 50 (03) : 622 - 634
[5] Single Event Effect Rate Analysis and Upset Characterization of FPGA Digital Signal Processors
Monreal, Roberto
Swift, Gary
Wang, Y. C.
Wirthlin, Michael
Nelson, Brent
2013 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2013,
[6] Monte-Carlo based on-orbit single event upset rate prediction for a radiation hardened by design latch
Warren, Kevin M.
Sierawski, Brian D.
Reed, Robert A.
Weller, Robert A.
Carmichael, Carl
Lesea, Austin
Mendenhall, Marcus H.
Dodd, Paul E.
Schrimpf, Ron D.
Massengill, Lloyd W.
Hoang, Tan
Wan, Hsing
De Jong, J. L.
Padovani, Rick
Fabula, Joe J.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2007, 54 (06) : 2419 - 2425

← 1 →