Long term reliability of photovoltaic modules

被引：0

作者：

Wohlgemuth, John H. ^{[1
]}

Cunningham, Daniel W. ^{[1
]}

Monus, Paul ^{[1
]}

Miller, Jay ^{[1
]}

Nguyen, Andy ^{[1
]}

机构：

[1] BP Solar Int Inc, Frederick, MD 21703 USA

来源：

CONFERENCE RECORD OF THE 2006 IEEE 4TH WORLD CONFERENCE ON PHOTOVOLTAIC ENERGY CONVERSION, VOLS 1 AND 2 | 2006年

关键词：

D O I：

暂无

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

BP Solar has utilized long term module exposure data and field return data to determine module lifetimes, expected failure rates and to identify failure mechanisms. While outdoor testing is a must for understanding PV reliability, it takes much too long to be of use in determining the effects of changes in materials, processes or equipment. This paper describes how BP Solar utilizes accelerated stress testing to verify the robustness of its new PV products.

引用

页码：2050 / +

页数：2

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