Viscosity characterization of highly filled photopolymerizable liquid encapsulants for microelectronic devices

被引:4
|
作者
Baikerikar, KK [1 ]
Scranton, AB [1 ]
机构
[1] Michigan State Univ, Dept Chem Engn, E Lansing, MI 48824 USA
关键词
D O I
10.1002/pc.10186
中图分类号
TB33 [复合材料];
学科分类号
摘要
In this paper the viscosity of novel photopolymerizable liquid encapsulants (PLEs) for microelectronic devices was characterized as a function of the particle size distribution of the fused silica filler. Microelectronic devices are typically encapsulated using a transfer molding process in which the molding compound flows over the leadframe and wire bonds as it fills the mold. The molding compound should have a low viscosity to minimize problems such as: 1) incomplete mold filling; 2) lead frame movement during cavity filling; and 3) displacement of the wires that connect the die with the leadframe (wire sweep). We have developed a photopolymerizable liquid encapsulant using an epoxy novolac-based vinyl ester resin that may alleviate these problems. In this contribution, we have investigated the blending of two different particle size distributions of fused silica to tailor the viscosity of PLEs for microelectronic applications. We have characterized the viscosity of highly filled PLEs containing 70.0, 72.0, and 74.0 wt% silica, and found that a blend of particle size distributions with a particle size ratio of 3.13 resulted in the best viscosity reduction. In addition, the PLE viscosity decreased slightly with increasing concentration of a silane coupling agent. The resulting PLEs exhibit low viscosities at ambient temperature while maintaining desirable material properties for microelectronic applications.
引用
收藏
页码:297 / 304
页数:8
相关论文
共 50 条
  • [31] PROPORTIONAL COUNTER FILLED WITH HIGHLY PURIFIED LIQUID XENON
    MIYAJIMA, M
    MASUDA, K
    HITACHI, A
    DOKE, T
    TAKAHASHI, T
    KONNO, S
    HAMADA, T
    KUBOTA, S
    NAKAMOTO, A
    SHIBAMURA, E
    NUCLEAR INSTRUMENTS & METHODS, 1976, 134 (02): : 403 - 405
  • [32] Transmission Fabry-Perot interference thermometry for thermal characterization of microelectronic devices
    Perpina, X.
    Jorda, X.
    Madrid, F.
    Vellvehi, M.
    Millan, J.
    Mestres, N.
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2006, 21 (12) : 1537 - 1542
  • [33] Characterization by ion beams of surfaces and interfaces of alternative materials for future microelectronic devices
    Krug, C
    Stedile, FC
    Radtke, C
    da Rosa, EBO
    Morais, J
    Freire, FL
    Baumvol, IJR
    APPLIED SURFACE SCIENCE, 2003, 212 : 556 - 562
  • [34] COMPUTATION OF VISCOSITY IN HIGHLY NONEQUILIBRIUM LIQUID-SYSTEMS
    GLADKOV, SO
    PHYSICS LETTERS A, 1990, 149 (5-6) : 275 - 278
  • [35] Experimental and numerical study of a stacked microchannel heat sink for liquid cooling of microelectronic devices
    Wei, Xiaojin
    Joshi, Yogendra
    Patterson, Michael K.
    JOURNAL OF HEAT TRANSFER-TRANSACTIONS OF THE ASME, 2007, 129 (10): : 1432 - 1444
  • [36] An Efficient Single Phase Liquid Cooling System for Microelectronic Devices with High Power Chip
    Tang, Gongyue
    Han, Yong
    Lau, Boon Long
    Zhang, Xiaowu
    Rhee, Daniel MinWoo
    2015 IEEE 17TH ELECTRONICS PACKAGING AND TECHNOLOGY CONFERENCE (EPTC), 2015,
  • [37] Characterization of a liquid-filled turbulence simulator
    Davis, CC
    Zhang, YM
    Plett, ML
    Polak-Dingels, P
    Barbier, PR
    Rush, DW
    ARTIFICIAL TURBULENCE FOR IMAGING AND WAVE PROPAGATION, 1998, 3432 : 38 - 49
  • [38] The evaluation of extensional viscosity of highly filled polyolefins composites films with calcium carbonate
    Klozinski, Arkadiusz
    Jakubowska, Paulina
    POLYMER ENGINEERING AND SCIENCE, 2019, 59 : E155 - E163
  • [39] Characterization of a valveless micropump based on liquid viscosity
    Matsumoto, S
    Maeda, R
    Klein, A
    MICROSCALE THERMOPHYSICAL ENGINEERING, 1999, 3 (01): : 31 - 42
  • [40] Quantitative thermal characterization of microelectronic devices by using CCD-based thermoreflectance microscopy
    Kim, Dong Uk
    Ryu, Seon Young
    Kim, Jun Ki
    Chang, Ki Soo
    RELIABILITY, PACKAGING, TESTING, AND CHARACTERIZATION OF MOEMS/MEMS, NANODEVICES, AND NANOMATERIALS XIII, 2014, 8975