Real Time Spectroscopic Ellipsometry Analysis of the Three-Stages of CuIn1-xGaxSe2 Co-Evaporation

被引:0
|
作者
Pradhan, Puja [1 ,2 ]
Aryal, Puruswottam [1 ,2 ]
Ibdah, Abdel-Rahman [1 ,2 ]
Aryal, Krishna [3 ]
Li, Jian [1 ,2 ]
Podraza, N. J. [1 ,2 ]
Marsillac, S. [3 ]
Collins, R. W. [1 ,2 ]
机构
[1] Univ Toledo, Ctr Photovolta Innovat & Commercializat, Toledo, OH 43606 USA
[2] Univ Toledo, Dept Phys & Astron, Toledo, OH 43606 USA
[3] Old Dominion Univ, Virginia Inst Photovolta, Norfolk, VA 23695 USA
关键词
ellipsometry; CIGS; photovoltaic cells; thickness measurement; THIN-FILMS;
D O I
暂无
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Real time spectroscopic ellipsometry (RTSE) has been applied for in-situ monitoring and analysis of all three processing stages in the co-evaporation of copper indium-gallium diselenide (CuIn1-xGaxSe2; CIGS) for high efficiency photovoltaic devices. The first stage entails indium-gallium selenide (In1-xGax)(2)Se-3 (IGS) deposition at a substrate temperature of 400 degrees C on soda lime glass coated with opaque Mo. In this stage, an accurate deposition rate and the final IGS bulk and surface roughness layer thicknesses can be obtained. In the second stage, co-evaporation of Cu and Se converts the IGS film to CIGS at an elevated substrate temperature of 570 degrees C. A bulk layer conversion model is justified and employed to analyze the second-stage RTSE data, resulting in steady-state IGS-to-CIGS thickness and volume fraction conversion rates. Near the end of the second stage, the formation of a Cu2-xSe layer on the CIGS surface can be tracked in terms of an effective thickness rate. The final Cu2-xSe effective thickness at the CIGS surface is obtained in a time interval spanning the end of the second stage to the beginning of the third. Finally, in the third stage, the Curich CIGS/Cu2-xSe is converted to slightly Cu-poor CIGS by co-evaporation of In, Ga, and Se. In this stage, the thickness conversion rate, and the endpoint bulk and surface roughness layer thicknesses can be obtained. In the three stages, the thickness rates and final thicknesses yield information on the total elemental fluxes, and the roughness evolution yields information on grain growth and near-surface coalescence processes. Modeling of the dielectric functions in future studies is expected to yield compositional information and thus relative metallic fluxes. Variations in the RTSE-deduced information can yield insights into run-to-run irreproducibilities that influence the solar cell performance. The application of these capabilities in the fabrication of solar cells with thick (2.5 mu m) and thin (0.3 mu m) absorbers is demonstrated.
引用
收藏
页码:2060 / 2065
页数:6
相关论文
共 50 条
  • [41] Optical Monitoring and Control of Three-Stage Coevaporated Cu(In1-xGax)Se2 by Real-Time Spectroscopic Ellipsometry
    Attygalle, Dinesh
    Ranjan, Vikash
    Aryal, Puruswottam
    Pradhan, Puja
    Marsillac, Sylvain
    Podraza, Nikolas J.
    Collins, Robert W.
    [J]. IEEE JOURNAL OF PHOTOVOLTAICS, 2013, 3 (01): : 375 - 380
  • [42] Optical Monitoring and Control of Three-Stage Coevaporated Cu(In1-xGax)Se2 by Real-Time Spectroscopic Ellipsometry
    Attygalle, Dinesh
    Ranjan, Vikash
    Aryal, Puruswottam
    Pradhan, Puja
    Marsillac, Sylvain
    Podraza, Nikolas J.
    Collins, Robert W.
    [J]. 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2, 2013,
  • [43] The optical and structural properties of CuIn1-x Ga x Se2 thin films fabricated with various Ga contents by using the co-evaporation technique
    Jo, Hyun-Jun
    Kim, Dae-Hwan
    Kim, Chan
    Hwang, Dae-Kue
    Sung, Shi-Joon
    Kim, Jeong-Hwa
    Bae, In-Ho
    [J]. JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2012, 60 (10) : 1708 - 1712
  • [44] Analysis of Si1-xGex:H thin films with graded composition and structure by real time spectroscopic ellipsometry
    Podraza, N. J.
    Li, Jing
    Wronski, C. R.
    Dickey, E. C.
    Horn, M. W.
    Collins, R. W.
    [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2008, 205 (04): : 892 - 895
  • [45] Formation of CuInSe2 and CuGaSe2 Thin Films Deposited by Three-Stage Thermal Co-Evaporation: A Real-Time X-Ray Diffraction and Fluorescence Study
    Rodriguez-Alvarez, Humberto
    Weber, Alfons
    Lauche, Jakob
    Kaufmann, Christian Alexander
    Rissom, Thorsten
    Greiner, Dieter
    Klaus, Manuela
    Unold, Thomas
    Genzel, Christoph
    Schock, Hans-Werner
    Mainz, Roland
    [J]. ADVANCED ENERGY MATERIALS, 2013, 3 (10) : 1381 - 1387
  • [46] Real time observation of phase formations by XRD during Ga-rich or In-rich Cu(In, Ga)Se2 growth by co-evaporation
    Pistor, Paul
    Zahedi-Azad, Setareh
    Hartnauer, Stefan
    Waegele, Leonard A.
    Jarzembowski, Enrico
    Scheer, Roland
    [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2015, 212 (09): : 1897 - 1904
  • [47] Evaluation of CuInSe2 Materials and Solar Cells Co-evaporated at Different Rates Based on Real Time Spectroscopic Ellipsometry Calibrations
    Sapkota, Dhurba R.
    Pradhan, Puja
    Irving, Richard
    Grice, Corey R.
    Phillips, Adam B.
    Heben, Michael J.
    Marsillac, Sylvain
    Podraza, Nikolas J.
    Collins, Robert W.
    [J]. 2021 IEEE 48TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), 2021, : 451 - 458
  • [48] Analysis of Compositionally and Structurally Graded Si:H and Si1-xGex:H Thin Films by Real Time Spectroscopic Ellipsometry
    Podraza, Nikolas J.
    Li, Jing
    Wronski, Christopher R.
    Horn, Mark W.
    Dickey, Elizabeth C.
    Collins, Robert W.
    [J]. AMORPHOUS AND POLYCRYSTALLINE THIN-FILM SILICON SCIENCE AND TECHNOLOGY-2008, 2008, 1066 : 253 - +
  • [49] Real-Time, In-Line, and Mapping Spectroscopic Ellipsometry for Applications in Cu(In1-xGax)Se2 Metrology
    Aryal, Puruswottam
    Pradhan, Puja
    Attygalle, Dinesh
    Ibdah, Abdel-Rahman A.
    Aryal, Krishna
    Ranjan, Vikash
    Marsillac, Sylvain
    Podraza, Nikolas J.
    Collins, Robert W.
    [J]. IEEE JOURNAL OF PHOTOVOLTAICS, 2014, 4 (01): : 333 - 339
  • [50] In situ spectroscopic ellipsometry and rigorous coupled wave analysis for real time profile evolution of atomic layer deposited films inside SiO2 nanotrenches
    Berriel, S. Novia
    Feit, Corbin
    Keller, Nick
    Rudawski, Nicholas G.
    Banerjee, Parag
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2022, 40 (06):