Mutual inductance critical current measurements in oxygen-deficient YBa2Cu3O7-delta thin films

被引:0
|
作者
Stenger, M
Barre, C
Joffrin, J
Prieur, JY
Wordenweber, R
机构
[1] UNIV PARIS 06, LAB AOMC, F-75252 PARIS, FRANCE
[2] FORSCHUNGSZENTRUM JULICH, FORSCHUNGSZENTRUM, ISI, D-52425 JULICH, GERMANY
关键词
D O I
10.1007/BF00753882
中图分类号
O59 [应用物理学];
学科分类号
摘要
Comparative studies of a standard four-contact DC method and a contactless mutual inductance setup have been carried out on the temperature dependence of the critical current of YBa2Cu3O(7-delta (YBCO) thin films. The DC measurements are restricted to low currents due to contact heating, whereas the mutual inductance method works well at higher currents. The temperature dependence of the values obtained by the two methods agrees fairly well in the temperature window accessible by both of them. Hence the DC values can be used to calibrate the mutual inductance ones. Thus, the critical current can be determined in a larger temperature range as compared to simple DC measurements. We have applied both techniques to two films with oxygen deficiencies delta of 0.08 and 0.31. The obtained calibration factor allowed us to determine the critical current density of a third sample with delta = 0.24 inductively. The critical current density drops dramatically with the oxygen content. At T/T-c = 0.80, the critical current of the film with delta = 0.08 is more than 40 times larger than that of the film with delta = 0.31.
引用
收藏
页码:1313 / 1318
页数:6
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