A user-friendly benchmark tool for MOS models

被引：1
|
作者：
Vasilopoulos, A. [1 ]
Papananos, Y. [1 ]
Bazigos, A. [1 ]
Nastos, N. [1 ]
机构：
[1] Natl Tech Univ Athens, Microelect Circuit Design Grp, Iroon Polytech 9, Athens 15780, Greece
来源：
PROCEEDINGS OF THE INTERNATIONAL CONFERENCE MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 2006年
关键词：
benchmark tests; CAD tool; MOS models; user-friendly program;
D O I：
10.1109/MIXDES.2006.1706556
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A user-friendly CAD tool for easily benchmarking models of MOS transistors is presented. The software is integrated in the Cadence((R)) environment and it is able to test any model supported by the Spectre((R)) simulator, such as BSIM or EKV. It is built in a modular manner so as to readily incorporate new tests if required, whereas the full set of IEEE recommended benchmarks is already supported. The tool features a GUI interface for setting up the various tests and viewing their results.
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页码：147 / +
页数：2
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