Simulation Approach to Modeling of the Avalanche Breakdown of a p-n Junction

被引：3

作者：

Shashkina, A. S. ^{[1
]}

Hanin, S. D. ^{[2
]}

机构：

[1] St Petersburg Univ Film & Televis, St Petersburg 191119, Russia

[2] Budyonny Mil Acad Commun, St Petersburg 194064, Russia

来源：

SEMICONDUCTORS | 2019年 / 53卷 / 06期

关键词：

D O I：

10.1134/S1063782619060198

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

The avalanche breakdown of a p-n junction is investigated experimentally in order to study the temporal distribution of microplasma pulses. It is revealed that the observed type of microplasma noise is not described by the existing model of processes occurring during the avalanche breakdown of a p-n junction. Acomputer model explaining the mechanisms of microplasma instability and taking into account the electric and temperature dependences of avalanche breakdown, which agrees with the experimental results, is developed using simulation modeling.

引用

页码：838 / 843

页数：6

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