Characterization of Novel Thin N-in-P Planar Pixel Modules for the ATLAS Inner Tracker Upgrade

被引:0
|
作者
Beyer, Julien-Christopher [1 ]
La Rosa, Alessandro [1 ]
Macchiolo, Anna [1 ]
Nisius, Richard [1 ]
Savic, Natascha [1 ]
机构
[1] Max Planck Phys Werner Heisenberg Inst, Munich, Germany
关键词
ATLAS; HL-LHC; radiation-tolerant detectors; silicon pixel detectors;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The ATLAS experiment will undergo a major upgrade of the tracker system in view of the high luminosity phase of the LHC (HL-LHC) to start operation in 2026. The most severe challenges are to be faced by the innermost layers of the pixel detector which will have to withstand a radiation fluence of up to 1.4x10(16) n(eq)/cm(2). Thin planar pixel modules are promising candidates to instrument these layers, thanks to the small material budget and their high charge collection efficiency after irradiation. Sensors of 100-200 mu m thickness, interconnected to FE-I4 read-out chips, are characterized with radioactive sources as well as testbeams at the CERN-SPS and DESY. The performance of sensors irradiated up to a fluence of 5 x 10(15) n(eq)/cm(2) is compared in terms of charge collection and hit efficiency. Highly segmented sensors are a challenge for the tracking in the forward region of the pixel system at the HL-LHC. To reproduce the performance of 50x50 mu m(2) pixels at high pseudo-rapidities, FE-I4 compatible planar pixel sensors are studied before and after irradiation in beam tests at high incidence angle (80 degrees) with respect to the short pixel direction. Results on cluster shape and hit efficiency will be shown.
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页数:5
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