Microstructural analysis by scanning thermal microscopy of a nanocrystalline Fe surface induced by ultrasonic shot peening

被引：17
|
作者：
Guo, FA
Trannoy, N
Lu, J
机构：
[1] Univ Reims, Lab Energet & Opt, Unite Therm & Analyse Phys, F-51687 Reims 2, France
[2] Univ Technol Troyes, LASMIS, Troyes, France
来源：
SUPERLATTICES AND MICROSTRUCTURES | 2004年 / 35卷 / 3-6期
关键词：
nanocrystalline material; thermal conductivity; scanning thermal microscopy; ultratine-grained layer;
D O I：
10.1016/j.spmi.2003.12.004
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
Experiments were carried out using a scanning thermal microscope (SThM) to investigate the ultrafine-grained microstructures in the surface layer of a pure iron sample produced by ultrasonic shot peening. The analysis of thermal properties by SThM shows that the thermal conductivity strongly depends on the grain size of the microstructure. The different contrasts on the thermal conductivity images are used to estimate the thickness of the affected surface layer produced by ultrasonic shot peening. The results demonstrate that the SThM can be used as a powerful tool for the microstructural analysis of the ultrafine-grained surface layer. (C) 2004 Elsevier Ltd. All rights reserved.
引用
收藏
页码：445 / 453
页数：9
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