Historical overview and future of optoelectronics reliability for optical fiber communication systems

被引：11
|
作者：
Fukuda, M [1 ]
机构：
[1] NTT Elect Corp, Atsugi, Kanagawa 2430198, Japan
来源：
MICROELECTRONICS RELIABILITY | 2000年 / 40卷 / 01期
关键词：
D O I：
10.1016/S0026-2714(99)00236-X
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The failure modes and failure mechanisms in optoelectronic devices, such as laser diodes, Light-emitting diodes, and photodiodes, are reviewed through a historical overview of device reliability and their future reliability is briefly discussed. (C) 2000 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码：27 / 35
页数：9
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