共 49 条
- [41] Effect of ceria particle-size distribution and pressure interactions in chemo-mechanical polishing (CMP) of dielectric materials CHEMICAL-MECHANICAL PLANARIZATION, 2003, 767 : 153 - 160
- [47] FUNDAMENTAL-STUDIES ON STRESS-DISTRIBUTION AND FRICTIONAL BEHAVIOR ON THE INTERFACE BETWEEN TOOL AND CHIPS IN VENEER CUTTING .10. EFFECT OF THE EDGE SHAPE AND SETTING OF THE PRESSURE BAR UPON THE STRESS-DISTRIBUTION AND THE FRICTIONAL COEFFICIENT ON THE TOOL RAKE-FACE (2) MOKUZAI GAKKAISHI, 1985, 31 (10): : 814 - 822
- [48] Impacts of low-pressure chemical vapor deposition-SiN capping layer and lateral distribution of interface traps on hot-carrier stress of n-channel metal-oxide-semiconductor field-effect-transistors JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2007, 46 (4B): : 2027 - 2031
- [49] Impacts of low-pressure chemical vapor deposition-SiN capping layer and lateral distribution of interface traps on hot-carrier stress of n-channel metal-oxide-semiconductor field-effect-transistors Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2007, 46 (4 B): : 2027 - 2031