Secret Key Classification Based on Electromagnetic Analysis and Feature Extraction Using Machine-Learning Approach

被引:3
|
作者
Mukhtar, Naila [1 ]
Kong, Yinan [1 ]
机构
[1] Macquarie Univ, Sydney, NSW, Australia
关键词
Side-Channel analysis; Embedded system security; Signal-processing; Machine-learning classification; Neural-network classification; SIDE-CHANNEL ATTACKS; TEMPLATE ATTACKS; AES;
D O I
10.1007/978-3-319-94421-0_6
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Despite having a secure algorithm running on a cryptographic chip, in an embedded system device on the network, secret private data is still vulnerable due to Side-Channel leakage information. In this paper, we have focused on retrieving secret-key information obtained from one of the Side Channels, namely Electromagnetic radiation signals. We have captured leaked Electromagnetic signals from a Kintex-7 FPGA, while AES is running over it, and analyzed them using machine and deep-learning based algorithms to classify each bit of the key. Moreover, we aim to analyze the effect of having different signal properties as features in these classification algorithms. The results will help in defining which features give maximum information about the captured signal, hence leading to key recovery.
引用
收藏
页码:80 / 92
页数:13
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