This study involved developing a low-power and high-mobility metal-oxide thin-film transistor that incorporated a bilayer IGZO/IGZO:Ti semiconductor material. Compared with control metal-oxide TFTs, the bilayer IGZO TFT through thickness modulation of IGZO: Ti can reach the smallest subthreshold swing (85 mV/decade) and the highest field effect mobility (49 cm(2)/Vs) at a drive voltage of <3 V. This performance level improvement can be attributed to the gettering effect caused by the IGZO: Ti capping layer and its dual advantages, which enhance device mobility and improve gate swing.
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Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, TaiwanNatl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, Taiwan
Kuo, Chuan-Wei
Chang, Ting-Chang
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Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 80424, Taiwan
Natl Sun Yat Sen Univ, Ctr Crystal Res, Kaohsiung 80424, TaiwanNatl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, Taiwan
Chang, Ting-Chang
Chen, Jian-Jie
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Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 80424, TaiwanNatl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, Taiwan
Chen, Jian-Jie
Zhou, Kuan-Ju
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Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 80424, TaiwanNatl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, Taiwan
Zhou, Kuan-Ju
Tsai, Tsung-Ming
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Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, TaiwanNatl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, Taiwan