BSIM Compact MOSFET Models for SPICE Simulation

被引:0
|
作者
Chauhan, Yogesh Singh [1 ]
Venugopalan, Sriram [2 ]
Paydavosi, Navid [2 ]
Kushwaha, Pragya [1 ]
Jandhyala, Srivatsava [2 ]
Duarte, Juan Pablo [2 ]
Agnihotri, Shantanu [1 ]
Yadav, Chandan [1 ]
Agarwal, Harshit [1 ]
Niknejad, Ali [2 ]
Hu, Chenming Calvin [2 ]
机构
[1] Indian Inst Technol Kanpur, Dept Elect Engn, Kanpur, Uttar Pradesh, India
[2] Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA
关键词
BSIM-CMG; BSIM-IMG; BSIM6; Symmetry; FinFET; UTBSOI;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Continuous technology advancements have forced MOSFET architecture to evolve from bulk to SOI to multigate MOSFETs. BSIM compact models have helped circuit designers to realize their designs first time correct using accurate physical models used in SPICE simulation. BSIM3 and BSIM4 are threshold voltage based bulk MOSFET models while BSIM6 is charge based bulk MOSFET model, which include physical effects such as mobility degradation, current saturation, high frequency models etc. BSIM6 has been developed especially to address symmetry around V-ds = 0, thus providing smooth higher order derivatives. BSIM-CMG is a CMC standard surface potential based model for common symmetric double, triple, quadruple and surround gate (nanowire) MOSFETs. Long channel DIBL also called Drain-Induced Threshold Shift (PITS) effect and asymmetric charge weighing factor etc. have been recently included in it. BSIM-IMG is a surface potential based model to simulate ultra-thin body devices such as UTBSOI but also other thin body devices such as MOS2 transistor.
引用
收藏
页码:23 / 28
页数:6
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