MOCVD derived double-sided YBa2Cu3O7-δ films on Y2O3/YSZ/CeO2 buffered textured metal substrates

被引：0

作者：

Xiong Jie ^{[1
]}

Zhang Fei ^{[1
]}

Xia YuDong ^{[1
]}

Liu Xin ^{[1
]}

Zhao RuiPeng ^{[1
]}

Zhao XiaoHui ^{[1
]}

Tao BoWan ^{[1
]}

机构：

[1] Univ Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Peoples R China

来源：

SCIENCE CHINA-TECHNOLOGICAL SCIENCES | 2014年 / 57卷 / 04期

基金：

中国国家自然科学基金;

关键词：

MOCVD; double-sided; YBCO; J(c); THIN-FILMS; DEPOSITION;

D O I：

10.1007/s11431-014-5488-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We have successfully employed metal-organic chemical vapor deposition (MOCVD) technique to simultaneously deposit double-sided YBa2Cu3O7-delta (YBCO) films on both sides of Y2O3/yttria-stabilized zirconia (YSZ)/CeO2 (YYC) buffered biaxially textured Ni-5 at.% W substrates, which is of great prospect to cut the production cost of YBCO coated conductors. X-ray diffraction analysis revealed that both sides of YBCO film were purely c-axis oriented and highly textured. The omega-scan of (005) YBCO and phi-scan of (103) YBCO yielded full width at half maximum (FWHM) values of 4.9 degrees and 6.6 degrees for one side of double-sided YBCO film, respectively, as well as 4.4 degrees and 6.4 degrees for the other side. The current transportation measurements performed on such double-sided 500 nm-thickness YBCO films showed the self-field critical current density (J(c)) at 77 K of 0.6 MA/cm(2) and 1.2 MA/cm(2), respectively. Further research is in the process of exploring new solution to improve the J(c) in practice.

引用

页码：720 / 724

页数：5

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