MOCVD derived double-sided YBa2Cu3O7-δ films on Y2O3/YSZ/CeO2 buffered textured metal substrates

We have successfully employed metal-organic chemical vapor deposition (MOCVD) technique to simultaneously deposit double-sided YBa2Cu3O7-delta (YBCO) films on both sides of Y2O3/yttria-stabilized zirconia (YSZ)/CeO2 (YYC) buffered biaxially textured Ni-5 at.% W substrates, which is of great prospect to cut the production cost of YBCO coated conductors. X-ray diffraction analysis revealed that both sides of YBCO film were purely c-axis oriented and highly textured. The omega-scan of (005) YBCO and phi-scan of (103) YBCO yielded full width at half maximum (FWHM) values of 4.9 degrees and 6.6 degrees for one side of double-sided YBCO film, respectively, as well as 4.4 degrees and 6.4 degrees for the other side. The current transportation measurements performed on such double-sided 500 nm-thickness YBCO films showed the self-field critical current density (J(c)) at 77 K of 0.6 MA/cm(2) and 1.2 MA/cm(2), respectively. Further research is in the process of exploring new solution to improve the J(c) in practice.