Beam Profiling at Focus: Essential for Beam Shaping

被引：0
|
作者：
Green, Lawrence I. [1 ]
机构：
[1] Ophir Spiricon Inc, Logan, UT 84321 USA
来源：
LASER BEAM SHAPING IX | 2008年 / 7062卷
关键词：
Beam Profiling; Laser Beam Diagnostics; Focused beam; Focused Spot; Beam Shaping; Cameras; Spatial Distribution; Temporal Profile;
D O I：
10.1117/12.796025
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Spatial laser beam profiling at focus is an essential part of quantitatively characterizing the shaped laser beam. We will discuss new methods that can profile most lasers at almost any power level.
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收藏
页数：11
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