Analog calibration of channel mismatches in time-interleaved ADCs

被引：15
|
作者：
Harpe, P. J. A. [1 ]
Hegt, J. A. [1 ]
van Roermund, A. H. M. [1 ]
机构：
[1] Eindhoven Univ Technol, Mixed Signal Microelect Grp, NL-5600 MB Eindhoven, Netherlands
来源：
INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS | 2009年 / 37卷 / 02期
关键词：
ADC; time-interleaved; calibration; offset; gain error; time-skew;
D O I：
10.1002/cta.545
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper presents a method for the on-chip measurement and correction of gain errors, offsets and time-skew errors in time-interleaved ADCs. With the proposed method, the errors can be measured and processed in the digital domain. Then, this information is used to optimize several digitally controlled analog parameters of the circuit, which minimize the effect of aforementioned mismatch errors. After optimization, the digital logic can be switched off completely in order to save power. Simulation results on a full-transistor implementation of the time-interleaved sampling structure show that the channel matching errors can be accurately compensated. Copyright (C) 2008 John Wiley & Sons, Ltd.
引用
收藏
页码：301 / 318
页数：18
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