Universal Conductance Fluctuation Due to Development of Weak Localization in Monolayer Graphene

被引:1
|
作者
Terasawa, Daiju [1 ]
Fukuda, Akira [1 ]
Fujimoto, Akira [2 ]
Ohno, Yasuhide [3 ]
Kanai, Yasushi [4 ]
Matsumoto, Kazuhiko [4 ]
机构
[1] Hyogo Coll Med, Dept Phys, Nishinomiya, Hyogo 6638501, Japan
[2] Osaka Inst Technol, Appl Phys, Fac Engn, Osaka 5358385, Japan
[3] Tokushima Univ, Grad Sch Technol Ind & Social Sci, Tokushima 7708501, Japan
[4] Osaka Univ, Inst Sci & Ind Res, Ibaraki 5670047, Japan
来源
关键词
Aharonov-Bohm effect; graphene; universal conductance fluctuation; weak localization; TEMPERATURE; TIME;
D O I
10.1002/pssb.201800515
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The relationship between two quantum interference effects, the universal conductance fluctuation (UCF) and the weak localization (WL), is investigated in monolayer graphene. We find that the local maxima in the UCF as a function of the gate voltage (Fermi energy) show stronger WL resistivity correction. By comparing experimental results with the predictions of the WL theory, we find that the ratio of the inelastic dephasing length to the elastic intervalley scattering length varies in accordance with the UCF. Furthermore, the temperature dependence of the UCF amplitude is also well described by the theory of WL resistivity correction. Therefore, we propose that the UCF can be attributed to the WL in graphene. In addition, we investigate the UCF in the presence of the magnetic field perpendicular to the graphene sheet. Our fast Fourier transform analysis of the magnetic field dependence of the UCF reveals a length scale that is related to the phase shift caused by the Aharonov-Bohm effect. We discuss the relationship between this effective length and the elastic scattering lengths.
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页数:7
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