Noise phenomena in semiconductor transport

被引:0
|
作者
Varani, L
机构
[1] Ctr. d'Electron. Micro-O., CNRS UMR 5507, Université Montpellier II, F-34095 Montpellier Cédex 5, Place E. Bataillon
来源
PHYSICA STATUS SOLIDI B-BASIC RESEARCH | 1997年 / 204卷 / 01期
关键词
D O I
10.1002/1521-3951(199711)204:1<442::AID-PSSB442>3.0.CO;2-2
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Different aspects of fluctuation phenomena in semiconductors are recieved. After a brief recall of the basic theoretical properties. the main numerical technique to obtain noise spectra are described. The main attention is drawn to the extraction of microscopic physical information from noise properties. To this end, several cases of interest are described, namely: relation between noise and characteristic times of the system. decomposition of noise spectra, noise properties in devices, discussion of the concept of noise temperature and noise in ballistic systems.
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页码:442 / 449
页数:8
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