共 50 条
- [24] ADMITTANCE ANALYSIS OF DX CENTERS IN Te-DOPED LPE N-TYPE AlGaAs MATERIAL. Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 1986, 7 (03): : 254 - 263
- [25] Devices with Te-doped InGaP layers NINTH INTERNATIONAL CONFERENCE ON ADVANCED SEMICONDUCTOR DEVICES AND MICROSYSTEMS, 2012, : 111 - 114
- [28] Thermoelectric Properties of Te-doped In0.9Si0.1Se with Enhanced Effective Mass Electronic Materials Letters, 2021, 17 : 340 - 346
- [29] Doping and defect formation in thermoelectric ZnSb doped with copper Semiconductors, 2014, 48 : 1571 - 1580
- [30] NATURE OF DEFECTS IN HEAVILY TE-DOPED GAAS REVUE DE PHYSIQUE APPLIQUEE, 1983, 18 (08): : 475 - 478