Full-Band and Atomistic Simulation of Realistic 40 nm InAs HEMT

A realistic 40 nm InAs high electron mobility transistor is studied using a two-dimensional, full-band, and atomistic Schrodinger-Poisson solver based on the sp(3)d(5)s* tight-binding model. Bandstructure non-paraboticity effects, strain, alloy disorder in the InGaAs and InAlAs barriers, as well as band-to-band tunneling in the transistor OFF-state are automatically included through the full-band atomistic model. The source and drain contact extensions are taken into account a posteriori by adding two series resistances to the device channel. The simulated current characteristics are compared to measured data and show a good quantitative agreement.