Selective-area growth of GaN on non- and semi-polar bulk GaN substrates

被引:10
|
作者
Okada, Shunsuke [1 ]
Miyake, Hideto [1 ]
Hiramatsu, Kazumasa [1 ]
Enatsu, Yuuki [2 ]
Nagao, Satoru [3 ]
机构
[1] Mie Univ, Dept Elect & Elect Engn, Tsu, Mie 5148507, Japan
[2] Mitsubishi Chem Corp, Ushiku, Ibaraki 3001295, Japan
[3] Mitsubishi Chem Grp Sci & Technol Res Ctr Inc, Yokohama, Kanagawa 2278502, Japan
关键词
VAPOR-PHASE EPITAXY; LATERAL OVERGROWTH; QUANTUM-WELLS; DENSITY; FABRICATION; LAYERS;
D O I
10.7567/JJAP.53.05FL04
中图分类号
O59 [应用物理学];
学科分类号
摘要
We carried out the selective-area growth of GaN and fabricated InGaN/GaN MQWs on non- and semi-polar bulk GaN substrates by MOVPE. The differences in the GaN structures and the In incorporation of InGaN/GaN MQWs grown on non- and semi-polar GaN substrates were investigated. In the case of selective-area growth, different GaN structures were obtained on (20 (2) over bar1) GaN, (20 (2) over bar(1) over bar) GaN, and (10 (1) over bar0) GaN substrates. A repeating pattern of {1 (1) over bar 01} and {1 (1) over bar0 (1) over bar} facets appeared on (20 (2) over bar1) GaN. Then, we fabricated InGaN/GaN MQWs on the facet structures on (20 (2) over bar1) GaN. The emission properties characterized by cathodoluminescence were different for {1 (1) over bar 01} and {1 (1) over bar0 (1) over bar} facets. On the other hand, for InGaN/GaN MQWs on non- and semi-polar GaN substrates, steps along the a-axis were observed by AFM. In particular on (20 (2) over bar1) GaN, undulations and undulation bunching appeared. Photoluminescence characterization indicated that In incorporation increased with the off-angle from the m-plane and also depended on the polarity. (C) 2014 The Japan Society of Applied Physics
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页数:5
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