Layer-Resolved Evolution of Organic Thin Films Monitored by Photoelectron Emission Microscopy and Optical Reflectance Spectroscopy

被引：12
|
作者：
Ghanbari, Ebrahim [1 ]
Wagner, Thorsten [1 ]
Zeppenfeld, Peter [1 ]
机构：
[1] Johannes Kepler Univ Linz, Inst Expt Phys, A-4040 Linz, Austria
来源：
JOURNAL OF PHYSICAL CHEMISTRY C | 2015年 / 119卷 / 42期
基金：
奥地利科学基金会;
关键词：
ALPHA-SEXITHIOPHENE; SINGLE-CRYSTAL; AG(111); SURFACES; INTERFACES; ABSORPTION; CU(110); GROWTH; STATES; PHASE;
D O I：
10.1021/acs.jpcc.5b08083
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Photoelectron emission microscopy (PEEM) and differential (optical) reflectance spectroscopy (DRS) have proven independently to be versatile analytical tools for monitoring the evolution of organic thin films during growth. In this paper, we present the first experiment in which both techniques have been applied simultaneously and synchronously. We illustrate how the combined PEEM and DRS results can be correlated to obtain an extended perspective on the electronic and optical properties of a molecular film dependent on the film thickness and morphology. As an example, we studied the deposition of the organic molecule alpha-sexithiophene on Ag(111) in the thickness range from submonolayers up to several monolayers.
引用
收藏
页码：24174 / 24181
页数：8
相关论文
共 50 条
  • [31] Optical characterization of thin nickel films on polymer substrates using reflectance difference spectroscopy
    Rinnerbauer, V.
    Schmidegg, K.
    Hohage, M.
    Sun, L. D.
    Flores-Camacho, J. M.
    Zeppenfeld, P.
    JOURNAL OF APPLIED PHYSICS, 2009, 105 (12)
  • [32] Supported iridium oxide films in aqueous electrolytes: Charge injection dynamics as monitored by time-resolved differential reflectance spectroscopy
    Chen, Youjiang
    Shi, Ping
    Scherson, Daniel
    ELECTROCHEMICAL AND SOLID STATE LETTERS, 2008, 11 (06) : F5 - F8
  • [33] DEPTH RESOLUTION IN PHOTOELECTRON MICROSCOPY OF ORGANIC SURFACES - PHOTOELECTRIC EFFECT OF PHTHALOCYANINE THIN-FILMS
    BURKE, CA
    BIRRELL, GB
    LESCH, GH
    GRIFFITH, OH
    PHOTOCHEMISTRY AND PHOTOBIOLOGY, 1974, 19 (01) : 29 - 34
  • [34] Growth of CuPc thin films on structured SiO2/Si(100) studied by metastable electron emission microscopy and photoelectron emission microscopy
    Onoue, M
    Ibe, T
    Miyauchi, J
    Shionoiri, M
    Abdureym, A
    Kera, S
    Okudaira, KK
    Harada, Y
    Ueno, N
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2003, 42 (6A): : 3588 - 3592
  • [35] Angle-resolved photoacoustic spectroscopy as a probe for orientation in thin organic films.
    Simpson, G
    Rowlen, K
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1997, 214 : 301 - PHYS
  • [36] Effects of organic vapour adsorption on the photoelectron emission from Au thin films in atmospheric air
    Inumaru, K
    Okubo, Y
    Fujii, T
    Yamanaka, S
    PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 2000, 2 (16) : 3681 - 3685
  • [37] Apparatus for solution jet beam deposition of organic thin films and in situ ultraviolet photoelectron spectroscopy
    Okabayashi, Y
    Kanai, K
    Ouchi, Y
    Seki, K
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2006, 77 (03):
  • [38] Ultraviolet photoelectron spectroscopy of thin films of new materials for multilayer organic light emitting diodes
    Casu, MB
    Imperia, P
    Schrader, S
    Falk, B
    SURFACE SCIENCE, 2001, 482 : 1205 - 1209
  • [39] Differential Reflectance Spectroscopy for In-Situ Monitoring of Organic Thin Films Growth in Vacuum Environment
    Yao Yao
    Hu Chun-guang
    Xu Zhen-yuan
    Zhang Lei
    Fu Xing
    Hu Xiao-tang
    SPECTROSCOPY AND SPECTRAL ANALYSIS, 2015, 35 (05) : 1320 - 1324
  • [40] Depth-resolved composition and chemistry of ultra-thin films by angle-resolved x-ray photoelectron spectroscopy
    Brundle, CR
    Conti, G
    Graoui, H
    Foad, M
    Hung, S
    Wang, C
    Uritsky, YS
    Mack, P
    Wolstenholme, J
    Characterization and Metrology for ULSI Technology 2005, 2005, 788 : 307 - 313
12345