Second-order Correlation Weak-value Measurements

被引:0
|
作者
Wen, Jianming [1 ,2 ]
Xiao, Yanhong [3 ]
Qu, Weizhi [3 ]
Kim, Yoon-Ho [4 ]
Jiang, Liang [1 ,2 ]
机构
[1] Yale Univ, Dept Appl Phys, New Haven, CT 06511 USA
[2] Yale Univ, Yale Quantum Inst, New Haven, CT 06511 USA
[3] Fudan Univ, Dept Phys, Shanghai 200433, Peoples R China
[4] Pohang Univ Sci & Technoligy, Dept Phys, Pohang 37673, South Korea
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
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页码:186 / 186
页数:1
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