Multimodal Scanning X-ray Microscopy at Nanoprobe Endstations of Fourth-Generation Synchrotrons

被引：0
|
作者：
Stuckelberger, Michael E. [1 ]
机构：
[1] Deutsch Elektronen Synchrotron DESY, Hamburg, Germany
来源：
SPECTROSCOPY | 2019年 / 34卷 / 07期
关键词：
D O I：
暂无
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
引用
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页码：42 / 44
页数：3
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