A Low Power Self-Turnoff Program Method for One-Time Programmable Memory

被引:0
|
作者
Shen, Ling [1 ]
Zheng, Yongan [1 ]
Yang, Fan [1 ]
Liao, Huailin [1 ]
Wang, Yangyuan [1 ]
机构
[1] Peking Univ, Inst Microelect, Key Lab Microelect Devices & Circuits, MOE, Beijing 100871, Peoples R China
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A novel self-turnoff control circuit for program process of one-time programmable (OTP) cell is proposed. Utilizing the current turnoff technology after the breakdown of OTP cell, it lowers the power consumption efficiently compared with traditional structures without turnoff mechanism. In addition, an additional delay circuit is also attached to the self-turnoff circuit to ensure the complete breakdown of OTP cell. The simulation results show that the average power consumption of proposed circuit decreases to about 3nA in the whole program process.
引用
收藏
页码:579 / 581
页数:3
相关论文
共 50 条
  • [31] A one-time password authentication method for low spec machines and on Internet protocols
    Tsuji, T
    Shimizu, A
    IEICE TRANSACTIONS ON COMMUNICATIONS, 2004, E87B (06) : 1594 - 1600
  • [32] A new 28 nm high-k metal gate CMOS logic one-time programmable memory cell
    Hsiao, Woan Yun
    Mei, Chin Yu
    Shen, Wen Chao
    Chih, Yue Der
    King, Ya-Chin
    Lin, Chrong Jung
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2014, 53 (04)
  • [33] High-Density FinFET One-Time Programmable Memory Cell With Intra-Fin-Cell-Isolation Technology
    Peng, Ping Chun
    Chen, Yu-Zheng
    Hsiao, Woan Yun
    Chen, Kuang-Hsin
    Lin, Ching-Pin
    Tien, Bor-Zen
    Chang, Tzong-Sheng
    Lin, Chrong Jung
    King, Ya-Chin
    IEEE ELECTRON DEVICE LETTERS, 2015, 36 (10) : 1037 - 1039
  • [34] Reliability for Pure CMOS One-time Programmable Memory Using Gate-Oxide Anti-fuse (eFuse)
    Wakai, Nobuyuki
    ISTFA 2008: CONFERENCE PROCEEDINGS FROM THE 34TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2008, : 349 - 353
  • [35] Investigation of silicon nanowire breakdown properties for the realization of one-time programmable memories
    Totaro, Massimo
    Pennelli, Giovanni
    Piotto, Massimo
    MICROELECTRONIC ENGINEERING, 2011, 88 (08) : 2413 - 2416
  • [36] Heavy ion SEE testing of Xilinx one-time programmable configuration PROMs
    George, J
    Swift, G
    Guertin, S
    Carmichael, C
    Rezgui, S
    Koga, R
    2004 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD, 2004, : 72 - 78
  • [37] Throwing a lifeline to a one-time Arab science power
    Stone, Richard
    SCIENCE, 2015, 347 (6219) : 223 - 223
  • [38] One-Time Computable Self-erasing Functions
    Dziembowski, Stefan
    Kazana, Tomasz
    Wichs, Daniel
    THEORY OF CRYPTOGRAPHY, 2011, 6597 : 125 - +
  • [39] Fabrication and Operation Methods of a One-time Programmable (OTP) Nonvolatile Memory (NVM) Based on a Metal-oxide-semiconductor Structure
    Cho, Seongjae
    Lee, Jung Hoon
    Jung, Sunghun
    Park, Se Hwan
    Park, Byung-Gook
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2011, 58 (05) : 1488 - 1493
  • [40] Inkjet-printed organic thin-film transistor and antifuse capacitor for flexible one-time programmable memory applications
    Jung, Soon-Won
    Na, Bock Soon
    You, In-Kyu
    Koo, Jae Bon
    Yang, Byung-Do
    Oh, Jae-Mun
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2014, 64 (01) : 74 - 78