Thermal evolution of microstructure in ion-irradiated GaN

被引:18
|
作者
Bae, In-Tae [1 ,2 ]
Jiang, Weilin [1 ]
Wang, Chongmin [1 ]
Weber, William J. [1 ]
Zhang, Yanwen [1 ]
机构
[1] Pacific NW Natl Lab, Richland, WA 99352 USA
[2] SUNY Binghamton, Small Scale Syst Integrat & Packaging Ctr, Binghamton, NY 13902 USA
关键词
amorphous semiconductors; annealing; crystal microstructure; electron diffraction; electron energy loss spectra; gallium compounds; III-V semiconductors; ion beam effects; nanofabrication; nanostructured materials; recrystallisation; semiconductor thin films; transmission electron microscopy; wide band gap semiconductors; SOLID-PHASE EPITAXY; BEAM; AMORPHIZATION; IMPLANTATION; DISORDER; DEFECTS;
D O I
10.1063/1.3106606
中图分类号
O59 [应用物理学];
学科分类号
摘要
The thermal evolution of the microstructure created by irradiation of a GaN single crystal with 2 MeV Au2+ ions at 150 K is characterized following annealing at 973 K using transmission electron microscopy. In the as-irradiated sample characterized at 300 K, Ga nanocrystals with the diamond structure, which is an unstable configuration for Ga, are directly observed together with nitrogen bubbles in the irradiation-induced amorphous layer. A simple model is proposed to explain Ga nanocrystal formation. Upon thermal annealing, the thickness of the amorphous layer decreases by similar to 13.1% and nanobeam electron diffraction analysis indicates no evidence for residual Ga nanocrystals, but instead reveals a mixture of hexagonal and cubic GaN phases in the annealed sample. Nitrogen molecules, captured in the as-irradiated bubbles, appear to disassociate and react with Ga nanocrystals during the thermal annealing to form crystalline GaN. In addition, electron energy loss spectroscopy measurements reveal an volume change of 18.9% for the as-irradiated amorphous layer relative to the virgin single crystal GaN. This relative swelling of the damaged layer reduces to 7.7% after thermal annealing. Partial recrystallization and structural relaxation of the GaN amorphous state are believed responsible for the volume change.
引用
收藏
页数:7
相关论文
共 50 条
  • [31] MICROSTRUCTURE IN ION-IRRADIATED CR-9-MO-2 STEEL (JFMS)
    KAWANISHI, H
    SEKIMURA, N
    SHIBATA, M
    ISHINO, S
    JOURNAL OF NUCLEAR MATERIALS, 1985, 133 (AUG) : 623 - 627
  • [33] Hardness and depth-dependent microstructure of ion-irradiated magnesium aluminate spinel
    Zinkle, S.J., 1600, Pharmacotherapy Publications Inc. (72):
  • [34] Microstructure Evolution in Ion-Irradiated Oxidized Zircaloy-4 Studied with Synchrotron Radiation Microdiffraction and Transmission Electron Microscopy
    Colas, Kimberly
    Verlet, Romain
    Tupin, Marc
    Cai, Zhonghou
    Wolski, Krzysztof
    Jublot, Michael
    Bossis, Philippe
    ZIRCONIUM IN THE NUCLEAR INDUSTRY: 18TH INTERNATIONAL SYMPOSIUM, 2018, 1597 : 385 - 414
  • [35] Characterising Ion-Irradiated FeCr: Hardness, Thermal Diffusivity and Lattice Strain
    Song, Kay
    Das, Suchandrima
    Reza, Abdallah
    Phillips, Nicholas W.
    Xu, Ruqing
    Yu, Hongbing
    Mizohata, Kenichiro
    Armstrong, David E. J.
    Hofmann, Felix
    ACTA MATERIALIA, 2020, 201 : 535 - 546
  • [36] DEFECT PRODUCTION IN ION-IRRADIATED ALUMINUM
    AVERBACK, RS
    BENEDEK, R
    MERKLE, KL
    SPRINKLE, J
    THOMPSON, LJ
    JOURNAL OF NUCLEAR MATERIALS, 1983, 113 (2-3) : 211 - 218
  • [37] INFRARED TRANSMISSION OF ION-IRRADIATED POLYMERS
    FINK, D
    HOSOI, F
    OMICHI, H
    SASUGA, T
    AMARAL, L
    RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1994, 132 (04): : 313 - 328
  • [38] Amorphisation kinetics in ion-irradiated ceramics
    Bolse, W
    Borowski, M
    Conrad, J
    Harbsmeier, F
    APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY - PROCEEDINGS OF THE FOURTEENTH INTERNATIONAL CONFERENCE, PTS 1 AND 2, 1997, (392): : 927 - 931
  • [39] Phonon localization in ion-irradiated GaAs
    Ishioka, K
    Nakamura, KG
    Kitajima, M
    SURFACE SCIENCE, 1996, 357 (1-3) : 495 - 499
  • [40] Modified π-states in ion-irradiated carbon
    Kovach, G.
    Karacs, A.
    Radnoczi, G.
    Csorbai, H.
    Guczi, L.
    Veres, M.
    Koos, M.
    Papadimitriou, L.
    Solyom, A.
    Peto, G.
    APPLIED SURFACE SCIENCE, 2008, 254 (09) : 2790 - 2796