UV-visible sensors based on polymorphous silicon

被引:2
|
作者
Guedj, C
Moussy, N
Rabaud, W
Cabarrocas, PRI
Tchakarov, S
Kleider, JP
机构
[1] CEA, Dept Optron, Lab Electron & Tech Ind, Grenoble, France
[2] Ecole Polytech, CNRS, UMR 7647, Phys Interfaces & Couches Minces Lab, F-91128 Palaiseau, France
[3] CNRS, UMR 8507, Lab Genie Elect Paris Supelec, F-91192 Gif Sur Yvette, France
关键词
D O I
10.1016/j.jnoncrysol.2004.03.083
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
UV-visible imaging systems can be used for various applications, including homeland security systems and mobile phones. Compared to conventional CCD technology, CMOS-based active pixel sensors provide several advantages, such as high integration, low voltage operation, low power consumption and low cost. In this approach, we have recently developed a novel technology using polymorphous silicon. This new material, fully compatible with above-IC silicon technology, is made of nanometer size ordered domains embedded in an amorphous matrix. The quantum efficiency of detectors made of this nano-structured material reach up to 80% at 550 nm and 30% in the UV range, depending of the design and the growth parameters. Furthermore, a record dark current of 20 pA/cm(2) at -3 V for 5 mum square pixels has been reached, and the sensor is perfectly linear over more than 6 decades of photocurrent. In addition, this new generation of sensors is significantly faster than their amorphous silicon counterparts. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:749 / 753
页数:5
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