Optical configuration for measurement in speckle interferometry

被引：19
|
作者：
Sirohi, RS
Mohan, NK
Santhanakrishnan, T
机构：
[1] Applied Optics Laboratory, Department of Physics, Indian Institute of Technology
来源：
OPTICS LETTERS | 1996年 / 21卷 / 24期
关键词：
D O I：
10.1364/OL.21.001958
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
An optical configuration for measurement of in-plane displacement and for contouring is reported. In this method an object point is viewed symmetrically with respect to surface normal and combined coherently at the image plane of the imaging system. Because the beams are combined by small apertures at the image plane, decorrelation sets in rather slowly. Owing to low decorrelation, fringes have been obtained for large in-plane deformations and large angular tilts. The method is simple to implement, and its sensitivity can be varied over a wide range. The configuration, therefore, extends the range of measurement. (C) 1996 Optical Society of America
引用
收藏
页码：1958 / 1959
页数：2
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