Optical configuration in speckle shear interferometry for slope change contouring with a twofold increase in sensitivity

被引：15
|
作者：
Santhanakrishnan, T [1 ]
Palanisamy, PK
Sirohi, RS
机构：
[1] Anna Univ, Ctr Laser Technol, Dept Phys, Madras 600025, Tamil Nadu, India
[2] Indian Inst Technol, Dept Phys, Appl Opt Lab, Madras 600036, Tamil Nadu, India
来源：
APPLIED OPTICS | 1998年 / 37卷 / 16期
关键词：
D O I：
10.1364/AO.37.003447
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We present a novel optical configuration that yields a fringe pattern that represents the slope changes of a three-dimensional object with a twofold increase in sensitivity. The method offers controllable sensitivity over a wide range. We accomplish it by modifying the in-plane displacement sensitive configuration of speckle interferometry. The detailed theory and the experimental results are presented with a brief discussion on the limiting aspects of the configuration. (C) 1998 Optical Society of America.
引用
收藏
页码：3447 / 3449
页数：3
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    Department of Physics, Center for Laser Technology, Anna University, Madras 600 025, India
    不详
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