Crossover of thickness dependence of critical current density Jc(T,H) in YBa2Cu3O7-δ thick films

被引：23

作者：

Li, Q ^{[1
]}

Suenaga, M

Ye, Z

Foltyn, SR

Wang, H

机构：

[1] Brookhaven Natl Lab, Div Mat Sci, Upton, NY 11973 USA

[2] Los Alamos Natl Lab, Los Alamos, NM 87545 USA

来源：

APPLIED PHYSICS LETTERS | 2004年 / 84卷 / 18期

关键词：

D O I：

10.1063/1.1737067

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Critical current density J(c) as a function of temperature T and magnetic field H was studied for high quality YBa2Cu3O7-delta (YBCO) films with thickness d=0.2, 1, and 3 mum by means of magnetization measurements of a circular disk in perpendicular field. We found that the thickness dependence of J(c)(H) for the YBCO thick films crossovers at high fields for T>50 K, where the 0.2-mum-thick film carries significantly lower J(c)(H) than the 3-mum-thick film at high fields, even though the zero- or low-field J(c) for the 0.2-mum-thick film is more than twice the value for the 3-mum-thick film. (C) 2004 American Institute of Physics.

引用

页码：3528 / 3530

页数：3

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