Angular dependence of the critical current in thin YBa2Cu3O7-δ films with unidirectional nanocracks

被引：5

作者：

Koren, G ^{[1
]}

Polturak, E

Levy, N

Deutscher, G

机构：

[1] Technion Israel Inst Technol, Crown Ctr Superconduct, IL-32000 Haifa, Israel

[2] Technion Israel Inst Technol, Dept Phys, IL-32000 Haifa, Israel

[3] Tel Aviv Univ, Raymond & Beverly Sackler Fac Exact Sci, Sch Phys & Astron, IL-69978 Tel Aviv, Israel

来源：

PHYSICAL REVIEW B | 2000年 / 61卷 / 05期

关键词：

D O I：

10.1103/PhysRevB.61.3734

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We investigated the angular dependence of the critical current I-c in the a-b plane of thin YBa2Cu3O7-delta films on (001) NdGaO3. Films grown on this particular substrate relieve their stress by developing unidirectional cracks of 2-4 nm width. These unidirectional nanocracks (NC's) behave as Josephson junctions. We have measured I-c(theta(NC)), where theta(NC) is the angle to these nanocracks, in a set of microbridges that were patterned on the film at various angles theta(NC) We fitted the results to a model of Andreev reflections in an anisotropic superconductor given by Tanaka and Kashiwaya [Phys. Rev. B 56, 892 (1997)]. We found that an order parameter having a d + is symmetry fits our data best at high temperatures, while no satisfactory fit could be obtained at low temperatures using a pure d-wave, s-wave, or d + is order parameter.

引用

页码：3734 / 3738

页数：5

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