Cu Diffusion Along Al Grain Boundaries

被引:0
|
作者
Dolgopolov, N. [1 ]
Rodin, A. [1 ]
Simanov, A. [1 ]
Gontar, I. [1 ]
机构
[1] Moscow State Inst Steel & Alloys, Moscow 119049, Russia
关键词
grain boundary diffusion; aluminum; copper; GROWTH; FILMS;
D O I
暂无
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Grain boundary diffusion of copper (GBD) in aluminum was investigated by EPMA in the temperature range from 300 to 400 degrees C. The triple product s delta D(gb) (s-segregation coefficient, delta - grain boundary width, D(gb) - GBD coefficient) was calculated using Fisher-Gibbs solution methods - by measuring of GB copper concentration as a functional penetration depth and the contour angle (at the top of diffusion wedge). In the first case s delta D(gb) = 5.1.10(-11) m(3)/s.exp(-102 kJ/mol/RT) and in the second case s delta D(gb) = 1.4.10(-11) m(3)/s.exp(-94 kJ/mol/RT)
引用
收藏
页码:1507 / 1513
页数:7
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