An algorithm for smoothing three-dimensional Monte Carlo ion implantation simulation results

被引:2
|
作者
Heitzinger, C [1 ]
Hössinger, A [1 ]
Selberherr, S [1 ]
机构
[1] Vienna Tech Univ, Inst Microelect, A-1040 Vienna, Austria
关键词
Monte Carlo simulation; ion implantation; Bernstein polynomials; smoothing operator;
D O I
10.1016/j.matcom.2003.11.010
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
We present an algorithm for smoothing results of three-dimensional Monte Carlo ion implantation simulations and translating them from the grid used for the Monte Carlo simulation to an arbitrary unstructured three-dimensional grid. This algorithm is important for joining various simulations of semiconductor manufacturing process steps, where data have to be smoothed or transferred from one grid to another. Furthermore different grids must be used since using ortho-grids is mandatory because of performance reasons for certain Monte Carlo simulation methods. The algorithm is based on approximations by generalized Bernstein polynomials. This approach was put on a mathematically sound basis by proving several properties of these polynomials. It does not suffer from the ill effects of least squares fits of polynomials of fixed degree as known from the popular response surface method. The smoothing algorithm which works very fast is described and in order to show its applicability, the results of smoothing a three-dimensional real world implantation example are given and compared with those of a least squares fit of a multivariate polynomial of degree 2, which yielded unusable results. (C) 2003 IMACS. Published by Elsevier B.V. All rights reserved.
引用
收藏
页码:219 / 230
页数:12
相关论文
共 50 条
  • [21] Parallel Monte Carlo simulation of ion implantation
    Hössinger, A
    Langer, E
    2000 INTERNATIONAL CONFERENCE ON ION IMPLANTATION TECHNOLOGY, PROCEEDINGS, 2000, : 203 - 208
  • [22] A new Monte Carlo simulation of three-dimensional microstructures and their evolution in polycrystalline
    SONG Xiaoyan
    School of Materials Science and Engineering
    Chinese Science Bulletin, 1999, (15) : 1432 - 1436
  • [23] A new Monte Carlo simulation of three-dimensional microstructures and their evolution in polycrystalline
    Song, XY
    Liu, GQ
    Gu, NJ
    CHINESE SCIENCE BULLETIN, 1999, 44 (15): : 1432 - 1436
  • [24] Three-Dimensional Electron Microscopy Simulation with the CASINO Monte Carlo Software
    Demers, Hendrix
    Poirier-Demers, Nicolas
    Couture, Alexandre Real
    Joly, Dany
    Guilmain, Marc
    de Jonge, Niels
    Drouin, Dominique
    SCANNING, 2011, 33 (03) : 135 - 146
  • [25] A simple and efficient three-dimensional Monte Carlo simulation of grain growth
    Song, XY
    Liu, GQ
    SCRIPTA MATERIALIA, 1998, 38 (11) : 1691 - 1696
  • [26] Monte Carlo results for three-dimensional self-avoiding walks
    Caracciolo, S
    Causo, MS
    Pelissetto, A
    NUCLEAR PHYSICS B-PROCEEDINGS SUPPLEMENTS, 1998, 63 : 652 - 654
  • [27] Three-dimensional kinetic lattice Monte-Carlo simulation of ion erosion of fcc(111) surfaces
    Strobel, M
    Heinig, KH
    Michely, T
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2001, 178 : 105 - 108
  • [28] Accurate three-dimensional simulation of damage caused by ion implantation
    Hössinger, A
    Selberherr, S
    1999 INTERNATIONAL CONFERENCE ON MODELING AND SIMULATION OF MICROSYSTEMS, 1999, : 363 - 366
  • [29] A computationally efficient method for three-dimensional simulation of ion implantation
    Burenkov, A
    Tietzel, K
    Hössinger, A
    Lorenz, J
    Ryssel, H
    Selberherr, S
    IEICE TRANSACTIONS ON ELECTRONICS, 2000, E83C (08): : 1259 - 1266
  • [30] Computationally efficient method for three-dimensional simulation of ion implantation
    Burenkov, A.
    Tietzel, K.
    Hoessinger, A.
    Lorenz, J.
    Ryssel, H.
    Selberharr, S.
    2000, IEICE of Japan, Tokyo, Japan (E83-C)