Simulation of Light Scattering in the Nanometer Range

被引：0
|
作者：
Tausendfreund, Andreas [1 ]
Patzelt, Stefan [1 ]
Goch, Gert [1 ]
Rockstroh, Lars
Simon, Sven
机构：
[1] Univ Bremen, D-2800 Bremen 33, Germany
来源：
SENSOREN UND MESSSYSTEME 2008 | 2008年 / 2011卷
关键词：
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
The available paper presents an efficient computation model to simulate light scattering measurements in the nanometer range. The new model based on a modified Huygens-Fresnel approximation enables to improve measuring methods without expensive and time consuming experiments. The model is verified by a roughness measuring principle based on a double scattering of light.
引用
收藏
页码：325 / 335
页数：11
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