Response to "Comment on 'Reliable extraction of the energy distribution of Si/SiO2 interface traps in ultrathin metal-oxide-semiconductor structures' " [Appl. Phys. Lett. 81, 3681 (2002)]

被引：3

作者：

Khosru, QDM ^{[1
]}

Nakajima, A ^{[1
]}

Yoshimoto, T ^{[1
]}

Yokoyama, S ^{[1
]}

机构：

[1] Hiroshima Univ, Res Ctr Nanodevices & Syst, Higashihiroshima 7398527, Japan

来源：

APPLIED PHYSICS LETTERS | 2002年 / 81卷 / 19期

关键词：

D O I：

10.1063/1.1519331

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：3683 / 3684

页数：2

共 33 条

[1] Comment on "Reliable extraction of the energy distribution of Si/SiO2 interface traps in ultrathin metal-oxide-semiconductor structures [Appl. Phys. Lett 80, 3952 (2002)]
Lundgren, P
Sveinbjörnsson, EO
Olafsson, HO
APPLIED PHYSICS LETTERS, 2002, 81 (19) : 3681 - 3682
[2] Reliable extraction of the energy distribution of Si/SiO2 interface traps in ultrathin metal-oxide-semiconductor structures
Khosru, QDM
Nakajima, A
Yoshimoto, T
Yokoyama, S
APPLIED PHYSICS LETTERS, 2002, 80 (21) : 3952 - 3954
[3] Response to "Comment on 'Problems in recent analysis of injected carrier dynamics in semiconductor quantum dots' " [Appl. Phys. Lett. 81, 565 (2002)]
Lang, R
APPLIED PHYSICS LETTERS, 2002, 81 (03) : 566 - 566
[4] Response to "Comment on 'Efficient electrical spin injection from a magnetic metal/tunnel barrier contact into a semiconductor' " [Appl. Phys. Lett. 81, 2130 (2002)]
Hanbicki, AT
Jonker, BT
APPLIED PHYSICS LETTERS, 2002, 81 (11) : 2131 - 2132
[5] Response to "Comment on 'Specific heat and thermodynamic properties of undercooled liquid cobalt' " [Appl. Phys. Lett. 81, 3290 (2002)]
Wang, N
Han, XJ
Wei, B
APPLIED PHYSICS LETTERS, 2002, 81 (17) : 3292 - 3292
[6] Comment on "Proposed model for calculating the standard formation enthalpy of binary transition-metal systems" [Appl. Phys. Lett. 81, 1219 (2002)]
Chen, XQ
Podloucky, R
Rogl, P
Wolf, W
APPLIED PHYSICS LETTERS, 2005, 86 (21)
[7] Response to "Comment on 'Forward current propagation beyond the virtual cathode formed by a high injection current' " [Appl. Phys. Lett. 81, 1530 (2002)]
Uhm, HS
Choi, EH
Choi, MC
APPLIED PHYSICS LETTERS, 2002, 81 (08) : 1532 - 1533
[8] Comment on "Efficient electrical spin injection from a magnetic metal/tunnel barrier contact into a semiconductor" [Appl. Phys. Lett. 80, 1240 (2002)]
Jansen, R
APPLIED PHYSICS LETTERS, 2002, 81 (11) : 2130 - 2130
[9] Response to "Comment on 'Stimulated emission from trap electronic states in oxide of nanocrystal Si' " [Appl. Phys. Lett. 93, 066101 (2008)]
Huang, Wei-Qi
Liu, Shi-Rong
Jin, Feng
Wang, Hai-Xu
Qin, Shui-Jie
APPLIED PHYSICS LETTERS, 2008, 93 (06)
[10] Response to "Comment on 'Thickness and temperature depending intermixing of SiOx/SiO2 and SiOxNy/SiO2 superlattices: Experimental observation and thermodynamic modeling'" [Appl. Phys. Lett. 109, 166101 (2016)]
Zhigunov, D. M.
Sarikov, A.
Chesnokov, Yu. M.
Vasiliev, A. L.
Zakharov, N.
Kashkarov, P. K.
APPLIED PHYSICS LETTERS, 2016, 109 (16)

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