NEW ALGORITHM TO DEDUCE INDIVIDUAL STRUCTURE-FACTOR PHASES BY REFERENCE-BEAM DIFFRACTION

被引：0
|
作者：
Shen, Q. [1 ]
Wang, J. [1 ]
机构：
[1] Cornell Univ, Chess Dept, Wilson Lab, Ithaca, NY 14853 USA
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2002年 / 58卷
关键词：
PHASE PROBLEM REFERENCE BEAM DIFFRACTION DIRECT METHOD;
D O I：
10.1107/S0108767302088232
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：C80 / C80
页数：1
相关论文
共 50 条
  • [21] ACCURATE STRUCTURE-FACTOR PHASE DETERMINATION BY ELECTRON-DIFFRACTION IN NONCENTROSYMMETRIC CRYSTALS
    ZUO, JM
    SPENCE, JCH
    HOIER, R
    PHYSICAL REVIEW LETTERS, 1989, 62 (05) : 547 - 550
  • [22] ACCURATE STRUCTURE-FACTOR PHASE DETERMINATION BY ELECTRON-DIFFRACTION IN NONCENTROSYMMETRIC CRYSTALS - COMMENT
    BIRD, DM
    JAMES, D
    KING, QA
    PHYSICAL REVIEW LETTERS, 1989, 63 (10) : 1118 - 1118
  • [23] X-RAY BIREFRINGENCE, FORBIDDEN REFLECTIONS, AND DIRECT OBSERVATION OF STRUCTURE-FACTOR PHASES
    TEMPLETON, DH
    TEMPLETON, LK
    ACTA CRYSTALLOGRAPHICA SECTION A, 1987, 43 : 573 - 574
  • [24] Faster acquisition of structure-factor amplitudes in surface X-ray diffraction experiments
    Torrelles, X
    Rius, J
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2004, 37 : 395 - 398
  • [25] ACCURATE STRUCTURE-FACTOR PHASE DETERMINATION BY ELECTRON-DIFFRACTION IN NONCENTROSYMMETRIC CRYSTALS - REPLY
    SPENCE, JCH
    ZUO, JM
    HOIER, R
    PHYSICAL REVIEW LETTERS, 1989, 63 (10) : 1119 - 1119
  • [26] A BAYESIAN-APPROACH TO EXTRACTING STRUCTURE-FACTOR AMPLITUDES FROM POWDER DIFFRACTION DATA
    SIVIA, DS
    DAVID, WIF
    ACTA CRYSTALLOGRAPHICA SECTION A, 1994, 50 : 703 - 714
  • [27] Structure-factor analysis of femtosecond micro-diffraction patterns from protein nanocrystals
    Kirian, Richard A.
    White, Thomas A.
    Holton, James M.
    Chapman, Henry N.
    Fromme, Petra
    Barty, Anton
    Lomb, Lukas
    Aquila, Andrew
    Maia, Filipe R. N. C.
    Martin, Andrew V.
    Fromme, Raimund
    Wang, Xiaoyu
    Hunter, Mark S.
    Schmidt, Kevin E.
    Spence, John C. H.
    ACTA CRYSTALLOGRAPHICA SECTION A, 2011, 67 : 131 - 140
  • [28] Experimental determination of electric-field-induced differences in structure-factor phases of the order of 2%
    Stahn, J
    Pucher, A
    Pietsch, U
    Zellner, J
    Weckert, E
    ACTA CRYSTALLOGRAPHICA SECTION A, 1999, 55 : 1034 - 1037
  • [29] Quantitative zone-axis convergent-beam electron diffraction (CBED) studies of metals. I. Structure-factor measurements
    Saunders, M
    Fox, AG
    Midgley, PA
    ACTA CRYSTALLOGRAPHICA SECTION A, 1999, 55 : 471 - 479
  • [30] THE MULTIPLE-DIFFRACTION EFFECT IN ACCURATE STRUCTURE-FACTOR MEASUREMENTS OF PTP2 CRYSTALS
    TANAKA, K
    KUMAZAWA, S
    TSUBOKAWA, M
    MARUNO, S
    SHIROTANI, I
    ACTA CRYSTALLOGRAPHICA SECTION A, 1994, 50 : 246 - 252
12345