Reflection Phase Characterization of the MEMS-based High Impedance Surface

被引：0
|
作者：
Du, Zhou [1 ]
Ala-Laurinaho, Juha [1 ]
Chicherin, Dmitry [1 ]
Raisanen, Antti V. [1 ]
Sterner, Mikael [2 ]
Oberhammer, Joachim [2 ]
机构：
[1] Aalto Univ, Dept Radio Sci & Engn SMARAD, POB 13000, FI-00076 Aalto, Finland
[2] KTH Royal Inst Technol, Microsyst Technol Lab, Stockholm, Sweden
来源：
2012 42ND EUROPEAN MICROWAVE CONFERENCE (EUMC) | 2012年
基金：
芬兰科学院;
关键词：
Electromagnetic reflection; High-impedance surfaces; Millimeter wave measurement; Micro-electro-mechanical devices; WAVE-GUIDE; MILLIMETER;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The reflection properties of the MEMS-based HIS illuminated from oblique angles of incidence have been characterized numerically, and a quasi-optical measurement setup has been built for experimental characterization. The resonance frequency and the relative bandwidth are slightly increasing with the increase of the angle of incidence. The comparison between the simulated and measured results is discussed.
引用
收藏
页码：617 / 620
页数：4
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