WAVELENGTH SCANNING DIFFRACTOMETRY WITH A QUADRUPLE MONOCHROMATOR.

被引：0
|
作者：
Hashihayata, M. [1 ]
Munakata, K. [1 ]
Kuwajima, S. [1 ]
Okazaki, A. [1 ]
Soejima, Y. [1 ]
机构：
[1] Kyushu Univ, Dept Phys, Fukuoka, Fukuoka 8128581, Japan
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 1999年 / 55卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
P12.01.001
引用
收藏
页码：228 / 228
页数：1
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