Method for measuring properties of high relative dielectric constant materials in a cutoff waveguide cavity

In this paper, a method for measuring properties of ceramic materials with relative dielectric constant value of 20-150 is proposed, It permits us to eliminate the operating TM01 delta-mode degeneration due to its frequency coincidence with other modes, including the ones of higher orders. Both that fact and the possibility of precise calculation of an unloaded quality factor for a cavity permit one to execute the accurate measurements of loss tangents values as low as (1 divided by 0, 5) x 10(-4), the error of dielectric constant measurement being equal to or less than 1%. The feasibility of precise measurement of the loaded Q-factor of a cavity by the readings of micrometric probe makes the use of frequency meters unnecessary.