interference lithography;
holographic;
gratings;
DFB lasers;
phase masks;
photoresist;
metrology;
motheye;
AR coating;
and photonic band gap;
D O I:
10.1117/12.472277
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
Interferometric Lithography has long been considered a viable means to achieve sub-micron resolution lithography over large areas without the use of traditional photomasks. However, traditional IL configurations set up in laboratories on optical isolation tables requires sophisticated optical designs and are greatly limited in both throughput and yield due to these complexities and manual configurations. The Microphotonics Group at OSC has introduced a series of fully automated interference lithography based tool systems that can achieve resolution down to 190nm period and address a multitude of applications requiring sub-micron resolution in a high-throughput, stabile, manufacturing environment.
机构:
US DOE, Ames Lab, Ames, IA 50011 USA
Iowa State Univ, Dept Phys & Astron, Ames, IA 50011 USAUS DOE, Ames Lab, Ames, IA 50011 USA
Park, Joong-Mok
Nalwa, Kanwar Singh
论文数: 0引用数: 0
h-index: 0
机构:
Iowa State Univ, Dept Elect & Comp Engn, Ames, IA 50011 USAUS DOE, Ames Lab, Ames, IA 50011 USA
Nalwa, Kanwar Singh
Leung, Wai
论文数: 0引用数: 0
h-index: 0
机构:
US DOE, Ames Lab, Ames, IA 50011 USA
Iowa State Univ, Dept Phys & Astron, Ames, IA 50011 USAUS DOE, Ames Lab, Ames, IA 50011 USA
Leung, Wai
Constant, Kristen
论文数: 0引用数: 0
h-index: 0
机构:
US DOE, Ames Lab, Ames, IA 50011 USA
Iowa State Univ, Dept Mat Sci & Engn, Ames, IA 50011 USAUS DOE, Ames Lab, Ames, IA 50011 USA
Constant, Kristen
Chaudhary, Sumit
论文数: 0引用数: 0
h-index: 0
机构:
US DOE, Ames Lab, Ames, IA 50011 USA
Iowa State Univ, Dept Elect & Comp Engn, Ames, IA 50011 USA
Iowa State Univ, Dept Mat Sci & Engn, Ames, IA 50011 USAUS DOE, Ames Lab, Ames, IA 50011 USA
Chaudhary, Sumit
Ho, Kai-Ming
论文数: 0引用数: 0
h-index: 0
机构:
US DOE, Ames Lab, Ames, IA 50011 USA
Iowa State Univ, Dept Phys & Astron, Ames, IA 50011 USAUS DOE, Ames Lab, Ames, IA 50011 USA