Diffraction imaging characteristics of slit for ultra-short laser pulse

被引：0
|
作者：
Yu, Xiang-yang [1 ]
Wu, Kun-xi [1 ]
Lu, Long-zhao [1 ]
机构：
[1] Sun Yat Sen Univ, State Key Lab Optoelect Mat & Technol, Guangzhou 510275, Guangdong, Peoples R China
来源：
INTERNATIONAL SYMPOSIUM ON PHOTONICS AND OPTOELECTRONICS 2015 | 2015年 / 9656卷
关键词：
ultra-short laser pulse; diffraction imaging of slit; far-field diffraction; Fraunhofer diffraction; SPECTRAL-LINES; REDSHIFTS; APERTURE; BEAM;
D O I：
10.1117/12.2190088
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We propose a simple and concise mathematical method based on the Fraunhofer approximation to analyze the imaging characteristics of slit for broadband light sources. Taking Gaussian-shaped ultra-short laser pulse for example, we investigated the diffraction imaging characteristics of ultra-short light sources through a single-slit and a double-slit. We deduced the mathematical expressions of the intensity distribution of far-field diffraction, and conducted numerical calculation and analysis. It turns out the pulse width of the ultra-short light source plays an important role in the diffraction imaging characteristics of slit. We also provide a quantitative criterion to measure the deviation in terms of far-field diffraction intensity distribution between broadband light source and the ideal monochromatic light source.
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页数：6
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