Structural visualization of α-SnSe by atomic force microscopy

被引：4

作者：

Morales, J ^{[1
]}

Sánchez, L ^{[1
]}

Santos, J ^{[1
]}

机构：

[1] Univ Cordoba, Fac Ciencias, Dept Quim Inorgan, E-14004 Cordoba, Spain

来源：

JOURNAL OF SOLID STATE CHEMISTRY | 1999年 / 148卷 / 02期

关键词：

D O I：

10.1006/jssc.1999.8455

中图分类号：

O61 [无机化学];

学科分类号：

070301 ; 081704 ;

摘要：

The surface structure of SnSe was studied by atomic force microscopy (AFM). The measured periodicities in the (100) and (101) planes as obtained from AFM images are consistent with those derived from the theoretical SnSe crystalline cell. The slight differences observed are the likely result of surface relaxation induced by the friction forces between the tip and the substrate. (C) 1999 Academic Press.

引用

页码：513 / 516

页数：4

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