Image correction for atomic force microscopy images with functionalized tips

被引：49
|
作者：
Neu, M. [1 ]
Moll, N. [2 ]
Gross, L. [2 ]
Meyer, G. [2 ]
Giessibl, F. J. [1 ]
Repp, J. [1 ]
机构：
[1] Univ Regensburg, Inst Expt & Appl Phys, D-93053 Regensburg, Germany
[2] IBM Res Zurich, CH-8803 Ruschlikon, Switzerland
来源：
PHYSICAL REVIEW B | 2014年 / 89卷 / 20期
关键词：
SINGLE-MOLECULE; REAL-SPACE; RESOLUTION; IDENTIFICATION; SPECTROSCOPY; GRAPHENE;
D O I：
10.1103/PhysRevB.89.205407
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
It has been demonstrated that atomic force microscopy imaging with CO-functionalizedtips provides unprecedented resolution, yet it is subject to strong image distortions. Here we propose a method to correct for these distortions. The lateral force acting on the tip apex is calculated from three-dimensional maps of the frequency shift signal. Assuming a linear relationship between lateral distortion and force, atomic force microscopy images could be deskewed for different substrate systems.
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收藏
页数：7
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