Guest editors' introduction: Design for yield and reliability

被引：21
|
作者：
Zorian, Y
Gizopoulos, D
机构：
[1] Virage Log, Fremont, CA 94538 USA
[2] LogicVis Inc, San Jose, CA 95110 USA
[3] Univ Piraeus, Dept Informat, Piraeus, Greece
来源：
IEEE DESIGN & TEST OF COMPUTERS | 2004年 / 21卷 / 03期
关键词：
D O I：
10.1109/MDT.2004.12
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：177 / +
页数：4
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